Course detail

Non-destructive diagnostics of nanostructures and interfaces

CEITEC VUT-DS109AAcad. year: 2013/2014

Not applicable.

Language of instruction

English

Mode of study

Not applicable.

Learning outcomes of the course unit

Not applicable.

Prerequisites

Not applicable.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Not applicable.

Assesment methods and criteria linked to learning outcomes

Not applicable.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

Not applicable.

Specification of controlled education, way of implementation and compensation for absences

Not applicable.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Colinge, J.P., Colinge, C.A.: Physics of Semiconductor Devices, Kluwer 2002
Kremer, F., Schönhals, A.: Broadband Dielectric Spectroscopy, Springer, Berlin 2002
Poole, Ch.P., Jr., Owens, F.J.: Introduction to Nanotechnology, Wiley Interscience, 2003
Saleh, B.E.A., Teich, M.C.: Základy fotoniky 1,2,3,4 Matfyzpress, Praha, 1994, 1995, 1996
Sze, S.M. Physics of Semiconductor Devices, John Wiley & Sons (third edition)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme STIAMN Doctoral

    branch ANTMT , 1 year of study, winter semester, compulsory-optional