Course detail

Diagnostics and testing of electronic systems

FEKT-CDTSAcad. year: 2016/2017

Diagnosis and testing of electronic circuits. Failure modes. Detection and fault location. Failure classification and mechanisms of disorders. Diagnostic system. Physical methods of technical diagnostics. Functional methods of technical diagnostics. Diagnosing analog circuits. Diagnosis of digital circuits. Built-in test systems, boundary scan, logic analyzers. Designing circuits for testability and diagnostic ability.

Language of instruction

English

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

Ing. Michal Pavlík, Ph.D.

Department

Department of Microelectronics (UMEL)

Learning outcomes of the course unit

Student is skilled on the basic terminology used in the field of technical diagnostics after successful completion of the course . Student understands the difference between physical and functional diagnostic methods. He knows the possible causes of measurement errors of electrical circuits and knows how to prevent them. Understands the principle on which it is based JTAG test interface. Can name the principles of electronic systems for ease of diagnostc ability.

Prerequisites

The secondary school level knowledge is required.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods include lecture and laboratory excercises.

Assesment methods and criteria linked to learning outcomes

Requirements for completion of a course are specified by a regulation issued by the lecturer responsible for the course and updated for every.

Course curriculum

Introduction to technical diagnostics, basic terminology
Failure classification of electronic components, integrated circuits
Methods for diagnosing ELT. equipment
Measurement errors and their causes
Practical examples of diagnosis of electrical circuits
The feedback systems (sources, amplifiers), stability
Practical examples of diagnostic feedback circuit
Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, modeling faults, testing of logic circuits, Boolean difference, creating tests for combinational circuits.
Built-in test systems (BIST) and Boundary Scan (JTAG)
Diagnosing analog signals
Proposal with regard to diagnostic ability, testing embedded systems - Development Models

Work placements

Not applicable.

Aims

To acquaint students with the basic concepts of technical diagnostics, to explain the differences between physical and functional approaches to diagnosis, clarify issues sources of errors that can occur during measurement and how to prevent them, get to know the basic methods of testing electrical blocks vestavětného familiar with the method of testing and JTAG interface contain, learn with the problems of circuit design for ease of diagnostic ability.

Specification of controlled education, way of implementation and compensation for absences

laboratory exercises

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)

Recommended reading

Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)

Classification of course in study plans

  • Programme EECC Bc. Bachelor's

    branch BC-MET , 2 year of study, summer semester, elective specialised
    branch BC-EST , 2 year of study, summer semester, elective interdisciplinary

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.

Syllabus

1. Introduction to technical diagnostics - basic concepts of technical diagnostics. Diagnostic system. Diagnostic resources. Diagnostic object. Diagnostic task. Diagnostic value. Diagnostics online and offline. Stages of technical diagnostics use. Technical diagnostics of pre-assembly phase. Technical diagnostics during start up of the circuit and control of the final product. Technical diagnostics in service practice, periodic checks and consistently applied.

2. Fault types of electronic components, integrated circuits - degradation mechanisms and cause malfunction. Terminology disorders. Disorders of passive and active components of electronic circuits. Disorders of integrated circuits. Causes of failures in the connecting system. Fault types neoživeného equipment. Number of single and multiple failures in a combinational network. Disorders of CMOS circuits.

3. Physical and function methods of the technical diagnostics. Mathematical models of diagnostic objects. Diagnostic tests. Forms of diagnostics. Periodic diagnostics. Continuous diagnostics. Display diagnostic test using a table, a procedure of testing. Detection testing. Localization testing. Graphic display diagnostic test using the tree. Build a set of faults, fault models, build diagnostic tests.

4. Methodology of practical procedure for the diagnosis of electrotechnical equipment division circuits, difficulties in measuring electrical variables

5. Practical examples of diagnosis of the electrical circuits

6. The feedback systems (sources, amplifiers), stability issue

7. Practical examples of diagnostic feedback circuit

8. Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, faults modeling, testing of logic circuits, Boolean difference, creating tests for combinational circuits.

9. Applications of functional diagnostics methods on objects with analog variables. The functional block diagram and logic diagram diagnostic facility with analog signals. Solution-oriented diagnostic tasks using cause-effect graphs for objects with analog signals.

10. Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logical systems. Generation of structural tests. Functional tests. Test generation using Boolean difference.

11. Built-in test systems (BIST) and Boundary Scan (JTAG) - history, principles, description by BSDL

12. Circuit design for easy diagnosis. Development of design methods for easy diagnosis. Structured design. Heuristic design. Built-in diagnostic tools. Diagnostic tests written to memory. Autonomic testing generated in real time. Generating pseudotriviálních tests. Failsafe. Security system. Fail safe circuits. Totally self-checking circuits. Other security methods.

Exercise in computer lab

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.

Syllabus

Failures analysis in bipolar transistor amplifier circuit
Failures analysis in basic blocks of the operational amplifier
Failures analysis in audio amplifier circuit, measuring of the parameters
Failures analysis in linear power supply circuit, measuring of the parameters
Basic measurements with logic analyzer, measuring of the gates delay
Analysis of communication with the logic analyzer, standard communication protocols 1
Analysis of communication with the logic analyzer, common communication protocols 2
The analysis of digital systems using a logic analyzer - a digital thermometer