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FSI-TMKAcad. year: 2017/2018
Introduction to light microscopy (historical overview completed by substantial pieces of knowledge of geometric and wave optics, light-microscope optical setup, basic techniques of light microscopy and practical knowledge), theoretical description of image formation (wave theory of image formation based on the Abbe theory), confocal microscopy (principle, setup of the device, imaging properties), fluorescence microscopy (principle, setup of the device, imaging properties), interference and holographic microscopy (principle, setup of the device, imaging properties), spectroscopic methods, X-ray photoelectron spectroscopy (XPS, principle, setup of the device, parameters), secondary ion mass spectrometry (SIMS, principle, setup of the device, parameters), low-energy ion scattering spectroscopy (LEIS, principle, setup of the device, parameters). Demonstrations and practical exercises on light microscopy and spectroscopy and on particle spectroscopy are carried out in laboratories.
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Specification of controlled education, way of implementation and compensation for absences
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branch M-FIN , 2 year of study, winter semester, compulsorybranch M-PMO , 2 year of study, winter semester, compulsory
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