English

Not applicable.

After the course, students should be able to distiguish different types of transport processes, understand the physical mechanisms of fluctuation processes and the excess transport of carriers. They should also have an overview of basic diagnostic methods and should be able to choose and use appropriate diagnostic techniques to study a particular problem. Based on these tools, the students should be able to design and develop diagnostic methods for the individual particular applications.

MEng/MSc degree or equivalent in Electrical Engineering, Materials, Physics or Chemistry.

Not applicable.

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

0-20 points project
0-80 points final exam

1. Structure of solids, their description, classification, failure.
2. Transport processes in solids, generation and recombination.
3. Fluctuation processes.
4. Noise diagnostics.
5. Partial discharges in insulators, Acoustic emission, Electromagnetic emission.
6. Dielectric relaxation spectroscopy (DRS).
7. Light microscopy. Optical microscopy, Confocal microscopy, Fluorescence microscopy, Infrared microscopy.
8. Electron microscopy. Transmission electron microscopy, Scanning electron microscopy, X-ray detection (EDS, WDS), surface modification (FIB, GIS), Environmental scanning electron microscopy.
9. Scanning probe microscopy. Atomic force microscopy, Scanning tunneling microscopy, Near-field scanning optical microscopy.
10. Infrared spectroscopy, Raman spectroscopy, Laser-induced breakdown spectroscopy.
11. Infrared thermography, Luminescence (Photoluminescence, Electroluminescence, Thermoluminescence).
12. X-ray diffraction analysis, Neutron diffraction.
13. X-ray computed tomography, Nuclear magnetic resonance.

Not applicable.

The objective of the course is the description and analysis, of transport, relaxation and stochastic mechanisms in solids. Students will learn the basic methods for study of these processes and with the basic methods of their measurement. The key objective of the seminar is, however, not so much a mere acquisition of theoretical and experimental finding but rather a deeper understanding of the physical nature of all three spectroscopic methods and the ability to use and develop these methods for practical applications.

Not applicable.

Not applicable.

Not applicable.

Kittel, Ch.: Introduction to Solid State Physics. 7th ed. Wiley, 1996. (EN)
Leng, Y.: Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. Wiley, 2009, ISBN 978-0-470-82299-9. (EN)
Réfrégier, P.: Noise Theory and Application to Physics. From Fluctuations to Information. Springer, 2004. (EN)
Sze, S.M., NG, Kwok, K. Physics of Semiconductor Devices. 3rd edittion, Wiley, 2006. (EN)
Workman, J., Springsteen, A.: Applied Spectroscopy – A Compact Reference for Practitioners, Elsevier Inc., 1998, ISBN 978-0-12-764070-9. (EN)

Not applicable.