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FSI-9VMSAcad. year: 2020/2021
In the course, which does not rely on the classical pattern of lectures but rather on consultations, the content is adapted to suit the orientation of the student's dissertation. Within the course, the student acquires the basics of all currently used methods for structure characterization (optical microscopy, transmission and scanning electron microscopy, methods of local chemical analysis in electron microscopy, scanning probe methods, X-ray structural analysis, etc.). The student will learn in depth the methods to be used while working on the dissertation.
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