Course detail

X-ray structure analysis methods

CEITEC VUT-DS206Acad. year: 2020/2021

Not applicable.

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

doc. RNDr. Petr Mikulík, Ph.D.

Department

Přírodovědecká fakulta (PřF MU)

Learning outcomes of the course unit

Not applicable.

Prerequisites

Not applicable.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Not applicable.

Assesment methods and criteria linked to learning outcomes

Not applicable.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

Not applicable.

Specification of controlled education, way of implementation and compensation for absences

Not applicable.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

B.Fultz, J.M.Howe, Transm. Electron Microscopy and Difractometry of Materials(Springer 2001)
C. Suryanarayana, M. G. Norton,X-Ray Diffraction (Springer 1998)
Y. Waseda, et. al., X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems, 2011

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme STIAMN Doctoral

    branch AM , 1 year of study, winter semester, compulsory-optional
    branch ANTMT , 1 year of study, winter semester, compulsory-optional