Course detail

Microscopy and Spectroscopy

FSI-TMKAcad. year: 2021/2022

Introduction to light microscopy (historical overview completed by substantial pieces of knowledge of geometric and wave optics, light-microscope optical setup, basic techniques of light microscopy and practical knowledge), theoretical description of image formation (wave theory of image formation based on the Abbe theory), confocal microscopy (principle, setup of the device, imaging properties), fluorescence microscopy (principle, setup of the device, imaging properties), interference and holographic microscopy (principle, setup of the device, imaging properties), spectroscopic methods, X-ray photoelectron spectroscopy (XPS, principle, setup of the device, parameters), secondary ion mass spectrometry (SIMS, principle, setup of the device, parameters), low-energy ion scattering spectroscopy (LEIS, principle, setup of the device, parameters).
Demonstrations and practical exercises on light microscopy and spectroscopy and on particle spectroscopy are carried out in laboratories.


Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

Ing. Daniel Zicha, CSc.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

Students will learn about the history and modern techniques and approaches in the field of light microscopy and spectroscopies (light and particle) and fundamental practical experience with relevant devices. Among others, it help them to select their own topic (for diploma or doctoral thesis).

Prerequisites

Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films, Geometrical and wave optics.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.

Assesment methods and criteria linked to learning outcomes

The assessment of a student is made upon his performance in written and oral part of the exam.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The goal of the course is to provide students an overview of the principle and methods of light microscopy and spectroscopy, and of particle spectroscopy and give them practical experience with relevant devices.

Specification of controlled education, way of implementation and compensation for absences

The presence of students is monitored by the tutor. Maximum of tolerated absence is 25 %.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

H. Friedrich: Scattering Theory. Springer, Heidelberg, New York, Dordrecht, London 2013. (EN)
A. R. Hibbs: Confocal Microscopy for Biologists. Springer, 2004.
D. B. Murphy, M.W. Davidson: Fundamentals of light microscopy and electronic imaging. Wiley‐Blackwell 2012. (EN)
E. Keprt: Teorie optických přístrojů 2, Teorie a konstrukce mikroskopu, SPN, Praha 1966. (CS)
H. Kuzmany: Solid-state spectroscopy. Springer, 2009. (EN)
Internetové zdroje: http://micro.magnet.fsu.edu/primer http://microscopyu.com (EN)
R. Chmelík: Materiály do praktika předmětu Mikroskopie a spektroskopie. Elektronický studijní text, Brno, 2014. (CS)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme N-FIN-P Master's 2 year of study, winter semester, compulsory

  • Programme M2A-P Master's

    branch M-PMO , 2 year of study, winter semester, compulsory

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

doc. Ing. Stanislav Průša, Ph.D.
Ing. Hana Uhlířová, Ph.D.
prof. RNDr. Radim Chmelík, Ph.D.
doc. Ing. Petr Bábor, Ph.D.
prof. RNDr. Josef Humlíček, CSc.
Ing. Zbyněk Dostál, Ph.D.
prof. Ing. Jan Čechal, Ph.D.
Mgr. Ota Samek, Ph.D.
prof. RNDr. Michal Kozubek, Ph.D.
doc. Ing. Pavel Pořízka, Ph.D.
Ing. Daniel Zicha, CSc.

Syllabus

Introduction to microscopy
Theory of imaging
Confocal microscopy
Fluorescence microscopy
Interference and holographic microscopy
Spectroscopic methods
X-ray photoelectron spectroscopy (XPS)
Secondary ion mass spectrometry (SIMS)
Low-energy ion scattering spectroscopy (LEIS)

Laboratory exercise

13 hod., compulsory

Teacher / Lecturer

prof. RNDr. Michal Kozubek, Ph.D.
prof. RNDr. Radim Chmelík, Ph.D.
prof. Ing. Jan Čechal, Ph.D.
Ing. Daniel Zicha, CSc.
doc. Ing. Stanislav Průša, Ph.D.
doc. Ing. Petr Bábor, Ph.D.
doc. Ing. Pavel Pořízka, Ph.D.
Mgr. Ota Samek, Ph.D.
Ing. Hana Uhlířová, Ph.D.
prof. RNDr. Josef Humlíček, CSc.
Ing. Zbyněk Dostál, Ph.D.

Syllabus

The calculations of supportive theoretical examples take place during the whole semester. Demonstrations and practical exercises in laboratory of optical microscopy, in laboratory of surfaces and thin films.