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Course detail
FSI-TSOAcad. year: 2022/2023
The course is devoted to the basic and advanced optical measurement methods and their engineering applications.
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Department
Learning outcomes of the course unit
Students acquire knowledge and skills necessary for designing of optical systems, measurements and observations. Students experience experimental work in a team, gain the competence to apply theoretical knowledge during the practical measurement and to present the results of their work in a written form.
Prerequisites
The knowledge of engineering and applied optics is expected.
Co-requisites
Planned learning activities and teaching methods
Assesment methods and criteria linked to learning outcomes
Course curriculum
Work placements
Aims
The goal of the course is to teach students the basic methods of the optical measurement including the measurement of optical elements and to familiarise students practically with the implementation and accuracy of interference, diffraction and microscopic methods.
Specification of controlled education, way of implementation and compensation for absences
Recommended optional programme components
Prerequisites and corequisites
Basic literature
Recommended reading
Classification of course in study plans
branch CZV , 1 year of study, winter semester, compulsory
Laboratory exercise
Teacher / Lecturer
Syllabus
Course Curriculum is formed by particular exercises which are completed according to instructions of the respective teachers.Exercises in the course:measurement of angles of optical prisms, wedges, and planparalel plates by means of the ray optics, precise measurements of angles of optical elements by interference methods, refractive index measurement, assembly and adjustment of the interferometer for the purpose of visualization of phase objects, laser-induced breakdown spectroscopy - LIBS, optical profilometry - surface-topography measurement, Fresnel diffraction, Fraunhofer diffraction, confocal microscopy, holographic microscopy.