Course detail

Imaging and Diagnostics of Nanostructures

FSI-9ZDNAcad. year: 2022/2023

Scanning probe microscopy; optical microscopy; electron microscopy; methods for imaging of chemical contrast; combined methods

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

prof. RNDr. Jiří Spousta, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

PhD student is offered to acquire an overview on current knowledge and contemporary methods used in the modern field of Diagnostics of nanostructures.

Prerequisites

Knowledge on fundamentals of quantum mechanics, theory of electromagnetic field, and solid state physics is expected.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Classes will have form of series of lectures, alternatively group or individual consultations.

Assesment methods and criteria linked to learning outcomes

The course is completed with discussion especially on questions associated with topics of the PhD thesis.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The aim of the course is to provide a survey of various methods for imaging and diagnostics of 1D and 0D nanostructures not only from the morphological and structural point of view, but also making possible to measure local electronic, optical, transport, and magnetic properties of nanostructures.

Specification of controlled education, way of implementation and compensation for absences

The attendance is checked.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

A. Stroscio, W. J. Keiser: Scanning Tunneling Microscopy. Academic Press Inc., 1993. (EN)
D. B. Williams, C. B. Carter: Transmission Electron Microscopy: A Textbook for Material Science. Springer, 2009. (EN)
E. Meyer, H. J. Hug: Scanning Probe Microscopy: The Lab on a Tip. Springer, 2004. (EN)
J. W. Rabalais: Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis. Wiley, 2002. (EN)
L. Novotny, B. Hecht: Principles of Nano-Optics. Cambridge University Press 2006. (EN)
L. Reimer: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer, 1998. (EN)
P. van der Heide: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices. Wiley, 2014. (EN)
P. van der Heide: X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices. Wiley, 2011. (EN)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme D-FIN-K Doctoral 1 year of study, winter semester, recommended course
  • Programme D-FIN-P Doctoral 1 year of study, winter semester, recommended course

Type of course unit

 

Lecture

20 hod., compulsory

Teacher / Lecturer

prof. RNDr. Jiří Spousta, Ph.D.

Syllabus

Introduction to scanning probe microscopy (SPM); scanning tunneling microscopy (STM) – principles of imaging using tunneling current and measurement modes; scanning force microscopy (SFM) – types of forces and measurement modes; atomic force microscopy (AFM); magnetic force microscopy (MFM); electric force microscopy (EFM) and Kelvin probe force microscopy (KPFM); scanning near-field optical microscopy (SNOM); other types of SPM; principles of construction of SPM; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM, etc.); optical and spectroscopic methods (e.g. confocal scanning Raman spectroscopy and photoluminescence spectroscopy and photoluminescence); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS); low energy ion scattering (LEIS); combined methods (e.g. STL, cathodoluminescence, TERS, etc.).