Course detail

Bases of Scientific Metrology and Quality Control

FSI-9ZVMAcad. year: 2023/2024

The subject is aimed at mastering the basics of scientific metrology, theory of measurement errors and uncertainties. Students will familiarize themselves with methods of process control, system and statistical analysis applicable in management of businesses and subordinate processes. Students will also understand the rules for process identification and selection of statistical variables of serial and job production. Students will master the rules of data collection and sorting, data analysis and their use for statistical process control.

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

doc. Ing. Róbert Jankových, CSc.

Department

Institute of Production Machines, Systems and Robotics (ÚVSSR)

Entry knowledge

Knowledge of fundamentals of metrology, manufacturing technology and materials, knowledge of physics and applied statistics, basic knowledge of quality control.

Rules for evaluation and completion of the course

Examination from the field of this cource curriculum and its application in the semestral work.
The subject is carried out as lectures and consultations, attendance is controlled.

Aims

The goal of the subject “Basics of scientific metrology and quality control” is the acquisition of theoretical and practical knowledge of scientific metrology and quality management systems in a way, that enables the PhD students to independently solve scientific tasks in this area.
The student will gain extensive and complex knowledge of scientific metrology and quality management systems, which will enable them to solve related problems in industrial practice with erudition.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

BUCHER, Jay L., ed. The Metrology Handbook. 2nd ed. Milwauke, Wis: ASQ Quality Press, 2012. ISBN 978-087-3898-386. (EN)
DRBÚL, M., ŠAJGALÍK, M. a kol. Strojárska metrológia a kvalita povrchov vytvorených technológiami obrábania. Žilina: Žilinská univerzita v Žiline, 2014, ITMS 22410320051. (SK)
Gao, W. Metrology. Berlin: Springer, 2019. ISBN 978-981-10-4939-2. (EN)
JAROŠOVÁ E. a NOSKIEVIČOVÁ, D. Pokročilejší metody statistické regulace procesu. Praha: Grada Publishing, 2015. ISBN 978-80-247-5355-3. (CS)
JURAN, J. M. a GODFREY, A. B. Juran's Quality Control Handbook. 5. ed. New York [u.a.]: McGraw-Hill, 1999. ISBN 00-703-4003-X. (EN)
MONTGOMERY, D. C. Introduction to Statistical Quality Control, Sixth Edition. Jefferson City: John Wiley & Sons, Inc., 2009. ISBN 978-0-470-16992-6. (EN)
RABINOVICH, Semyon G. Evaluating measurement accuracy. New York: Springer, 2013. ISBN ISBN978-1-4614-6716-8. (EN)
TOŠENOVSKÝ, J. a NOSKIEVIČOVÁ, D. Statistické metody pro zlepšování jakosti. Ostrava: Montanex a.s., 2000. ISBN 80-7225-040-X. (CS)
WILLINK, R. Measurement Uncertainty and Probability. Cambridge: Cambridge University Press, 2013. ISBN 978-113-9135-085. (EN)

Recommended reading

CURTIS, Mark A. and Francis T. FARAGO. Handbook of dimensional measurement. Fifth edition. South Norwalk: Industrial Press, 2014. ISBN 978-0-8311-3465-5. (EN)
JANKOVÝCH, R. a MAJTANÍK, J. Quality of Weapons and Ammunition I. 1. vyd. Brno: Univerzita obrany, 2008. 84 s. ISBN 978-80-7231-585-7. (EN)
KUPKA, K. Statistické řízení jakosti. Pardubice: TriloByte Statistical Software, 1997. ISBN 80-238-1818-X. (CS)
Wheeler, D.J. Understanding Statistical Process Control. Knoxville, Tennessee: SPC Press, 2019. ISBN 978-0-945320-69-2. (EN)

Classification of course in study plans

  • Programme D-KPI-P Doctoral 1 year of study, winter semester, recommended course
  • Programme D-KPI-K Doctoral 1 year of study, winter semester, recommended course

Type of course unit

 

Lecture

20 hod., optionally

Teacher / Lecturer

doc. Ing. Róbert Jankových, CSc.

Syllabus

1. Introduction to scientific metrology, system of metrological
confirmation.
2. Measurement errors and their elimination.
3. Measurement trueness and precision, repeatability and reproducibility.
4. Measurement uncertainty in ISO GPS.
5. Statistical tools in metrology
6. Statistical process control. General rules for SPC.
7. Control charts for variables.
8. Process capability. Indexes of shortterm and longterm capability.
9. Measurement capability.
10. Control charts for attributes.