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FSI-9KPOAcad. year: 2023/2024
The use of the interaction between electromagnetic radiation and solid surfaces for the evaluation of their quality
Optical profilometry
The use of the electromagnetic radiation scattering from the surfaces mentioned.
The determination of optical parameters of thin films.
Language of instruction
Mode of study
Guarantor
Department
Entry knowledge
As part of the introduction to the study of the subject, students will be introduced to the following concepts with the extent necessary to master the subject.
Rules for evaluation and completion of the course
The partial examination of doctoral studies.
Oral exam, arbitrary literature is allowed.
Aims
Due to a request from the optical industry, the topic was narrowed to surfaces generated for industrial optical applications. The quality of these surfaces is determined primarily by their shape, roughness, and coating with appropriate thin films. Therefore, students will become familiar with the basis of optical profilometry, the use of the electromagnetic radiation scattering from the surfaces mentioned, and the determination of optical parameters of thin films.
Students will become familiar with
Study aids
Prerequisites and corequisites
Basic literature
Recommended literature
Classification of course in study plans
Lecture
Teacher / Lecturer
Syllabus