Course detail

Selected Topics in Electron Microscopy

FSI-TM0Acad. year: 2024/2025

The course deals with problems of electron microscopy and related methods. Accented are physical principles, construction and production of electron microscopes.

Language of instruction

Czech

Number of ECTS credits

2

Mode of study

Not applicable.

Guarantor

Ing. Tomáš Vystavěl

Department

Institute of Physical Engineering (ÚFI)

Entry knowledge

Knowledge of electromagnetism on the level defined by the textbook HALLIDAY, D. - RESNICK, R. - WALKER, J.: Fundamentals of Physics. J. Wiley and Sons.

Rules for evaluation and completion of the course

credits, based on final discussion
Participation at lectures

Aims

After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Knowledge of the principles of construction of electron microscope and functionality of its parts.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003. xix, 689 s. ISBN 0-306-47292-9
REIMER, Ludwig. Scanning electron microscopy :physics of image formation and microanalysis. Berlin, 1985. 457 s. ISBN 3-540-13530-8
REIMER, Ludwig. Transmission Electron Microscopy :Physics of Image Formation and Microanalysis. 3. ed. Berlin, 1993. 545 s. ISBN 3-540-56849-2

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme B-FIN-P Bachelor's 3 year of study, winter semester, elective
  • Programme N-FIN-P Master's 1 year of study, winter semester, elective
    2 year of study, winter semester, elective
  • Programme N-PMO-P Master's 2 year of study, winter semester, elective

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

Ing. Tomáš Vystavěl

Syllabus

1. Basics of scanning and transmission electron microscopy
2. Applications of electron microscopy
3. Electron and ion optics
4. Sources of electrons and ions
5. Interaction of electrons and ions with solid state matter
6. Ssignal detection im electron microscopy
7. Vacuum system
8. Sample manipulation inside electron microscope
9. Sample stages
10. Electron microscope as a system
11. Contrast of image 1. (SEM)
12. Contrast of image 2. (TEM)
13. Electron microscope as an analytical lab
14. Mopdern trends in electron microscopy
15. Practical demonstration