Course detail
Theory of Measurements, Measurement Techniques and Technical Diagnostics
FSI-9TTDAcad. year: 2024/2025
The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.
Language of instruction
Czech
Mode of study
Not applicable.
Guarantor
Department
Entry knowledge
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".
Rules for evaluation and completion of the course
An examination composed from oral and written part.
Participation at every course parts.
Participation at every course parts.
Aims
Describe physical principles of selected measuring methods and measuring equipments.
Understanding of selected physical principles and their application in measurements, sensors and equipments.
Understanding of selected physical principles and their application in measurements, sensors and equipments.
Study aids
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978 (EN)
DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 (EN)
RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 (EN)
WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 (EN)
WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 (EN)
DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 (EN)
RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 (EN)
WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 (EN)
WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 (EN)
Recommended reading
DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.
Normy: Vyjadřování nejistoty při měření.
JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.
Normy: Vyjadřování nejistoty při měření.
Classification of course in study plans
Type of course unit
Lecture
20 hod., optionally
Teacher / Lecturer
Syllabus
General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.