Přístupnostní navigace
E-application
Search Search Close
Course detail
FEKT-MPA-DMEAcad. year: 2024/2025
Diagnostic methods for determining properties and parameters of electrical insulating materials and systems. Microscopic, spectroscopic and diffractometric diagnostic methods, physical principles and applications. Diagnostic methods for determining the properties of semiconductor wafers and structures, contamination and defects in semiconductor materials. Processing and evaluation of measured data. Translated with www.DeepL.com/Translator (free version)
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Department
Entry knowledge
Rules for evaluation and completion of the course
Aims
Study aids
Prerequisites and corequisites
Basic literature
Recommended reading
Classification of course in study plans
Lecture
Teacher / Lecturer
Laboratory exercise