Course detail

Diagnostics and Testing of Electronic Systems

FEKT-BPC-DTSAcad. year: 2025/2026

Diagnosis and testing of electronic circuits. Failure modes. Detection and fault location. Failure classification and mechanisms of disorders. Diagnostic system. Physical methods of technical diagnostics. Functional methods of technical diagnostics. Diagnosing analog circuits. Diagnosis of digital circuits. Built-in test systems, boundary scan, logic analyzers. Designing circuits for testability and diagnostic ability.

Language of instruction

Czech

Number of ECTS credits

6

Mode of study

Not applicable.

Guarantor

Ing. Michal Pavlík, Ph.D.

Department

Department of Microelectronics (UMEL)

Entry knowledge

The subject knowledge on the secondary school level is required.

Rules for evaluation and completion of the course

The evaluation of the subject is given by the point gain divided between the final exam, for which it is possible to get 60 points, and the evaluation of the laboratory exercises, which are worth 40 points. Within the laboratories, submitted protocols are evaluated 4x 5 points, active access during circuit analysis in a simulation environment 8 points and the final test of acquired analog circuit analysis skills 12 points. 

Aims

To acquaint students with the basic concepts of technical diagnostics, to explain the differences between physical and functional approaches to diagnosis, clarify issues sources of errors that can occur during measurement and how to prevent them, get to know the basic methods of testing electrical blocks vestavětného familiar with the method of testing and JTAG interface contain, learn with the problems of circuit design for ease of diagnostic ability.
Student is skilled on the basic terminology used in the field of technical diagnostics after successful completion of the course . Student understands the difference between physical and functional diagnostic methods. He knows the possible causes of measurement errors of electrical circuits and knows how to prevent them. Understands the principle on which it is based JTAG test interface. Can name the principles of electronic systems for ease of diagnostc ability.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)

Recommended reading

Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)

Classification of course in study plans

  • Programme BPC-NCP Bachelor's 2 year of study, summer semester, compulsory-optional
  • Programme BPC-ECT Bachelor's 0 year of study, summer semester, elective
  • Programme BPC-MET Bachelor's 2 year of study, summer semester, compulsory-optional

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.

Syllabus

  1. Introduction to technical diagnostics - basic concepts of technical diagnostics. Diagnostic system. Diagnostic tools. Diagnostic object. Diagnostic task. Diagnostic quantity. Physical and functional methods of technical diagnostics. Mathematical models of diagnostic objects. Diagnostic tests. Diagnostics in operation and out of operation. Technical diagnostics deployment phase. 
  2. Types of failures of electronic components, integrated circuits - degradation mechanisms and occurrence of failures. Nomenclature of faults. Malfunctions of passive and active elements of electronic circuits. Integrated circuit failures. Causes of failures in the interconnection system. Types of failures of non-revivable equipment. The number of single and multiple faults in the combination network. Faults in CMOS circuits. 
  3. Methodology of the general procedure in the diagnosis of electrotechnical devices with a focus on fault localization, division of circuits, problems in the measurement of electrical quantities
  4. Diagnostics of the measuring arrangement - selection suitable measuring device, measurement errors caused by inappropriate arrangement, prevention of these errors, alternative methods
  5. Feedback systems - such as power supplies (switched and linear) or amplifiers, stability and its criteria , the effect of the phase reserve on the response of the circuit, other parameters determined for feedback systems, stability measurement with a network analyzer
  6. Modeling of faults in digital systems - types of considered faults and their models, categorization of objects according to distribution signal, defining critical paths, creating tests for combinational circuits, displaying the diagnostic test using a table, testing procedure. Detection testing. Localization testing. Graphic display of the test using a diagnostic tree
  7. Creating a test for testing digital circuits - Boolean difference method, elephants of formulas, treatment of asynchronous signals
  8. Built-in test systems (BIST) - Boundary Scan (JTAG) interface, history, principles, BSDL language
  9. Application of functional diagnostics methods to objects with analog variables quantities. Functional block diagram and logic diagram of the diagnostic object with analog signals. Solving diagnostic tasks using oriented cause-effect graphs for objects with analog signals.
  10. Design for easy diagnostics. Development of design methods for easy diagnosis. Structured design. Heuristic design methods. Built-in diagnostic tools. Diagnostic tests written to memory. Autonomous tests generated in real time. Generating pseudo-trivial tests. Security against failures. System security. Fail safe circuits. Fully self-controlled circuits. Other security methods. 

Exercise in computer lab

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.

Syllabus

  1. Analysis of the appearance of faults in the circuit of a bipolar transistor amplifier
  2. Analysis of the appearance of faults in a two-stage amplifier
  3. Analysis of the appearance of faults in the circuit of an audio amplifier
  4. Analysis of the appearance of faults in a linear power supply