Course detail

Charakterizace polovodičových součástek

FEKT-BPC-CPSAcad. year: 2025/2026

The subject is devoted to the problem of measuring the properties of semiconductor components using automated measurement tools and processing the measured data on a computer. The aim of the course is to familiarize students with the basic principles of automated measurement systems using the LabVIEW, MATLAB environment and to provide a comprehensive overview of the automated methods of measuring semiconductor components and the use of the LabVIEW, MATLAB environment when processing measured data on a computer. 

Language of instruction

Czech

Number of ECTS credits

Mode of study

Not applicable.

Guarantor

prof. Ing. Jan Leuchter, Ph.D.

Department

Department of Microelectronics (UMEL)

Entry knowledge

Basic knowledge of physics, mathematics and electrical circuits is required. Completion of BPC-ESO and BPC-EL1 is a mandatory prerequisite. 

Work in the laboratory is subject to a valid qualification of "instructed person", which students must obtain before starting classes. Information on this qualification can be found in the Dean's Directive Acquainting Students with Safety Regulations. 

Rules for evaluation and completion of the course

Credit conditions: completion of measured tasks and handing in prepared protocols in the required quality.

Exam conditions: proof of knowledge of the subject in the written and oral parts of the exam.

Point evaluation (max. 100 points): max. 30 points for work during the semester; max. 70 points per exam. The final exam consists of two parts (written and oral) and is evaluated for a total of 70 points. 

Aims

LEARNING OBJECTIVES

The graduate of the course will acquire general knowledge in the field of measurement of semiconductor components and will gain an overview of the possibilities of automated measurement and current trends in the use of computers for data collection to identify the parameters of semiconductor components. The graduate of the subject is able to design and practically implement a measuring system for the identification of semiconductor components using the LabVIEW and MATLAB environments. 

Study aids

https://www.dps-az.cz/clanky/id:22208/nove-v-e-archivu-zaklady-labview 

https://www.youtube.com/watch?v=P8y3tKJQadE 

https://www.youtube.com/watch?v=joilU9m-sNk 

https://ww2.mathworks.cn/en/videos/getting-started-with-matlab-1564521672719.html 

https://ww2.mathworks.cn/en/videos/matlab-tools-for-test-and-measurement-81553.html 

Prerequisites and corequisites

Not applicable.

Basic literature

Boušek J., Kosina P., Mojrova B.: Elektronické součástky, FEKT VUT V BRNĚ, elektronické skriptum (CS)
Jennings, Richard. LabVIEW Graphical Programming. New York, N.Y., McGraw-Hill Education, 2020. (EN)
Vlach J., Havlíček J., Vlach M.: Začínáme s LabVIEW. Praha: BEN - technická literatura, 2008. ISBN 978-80-7300-245-9. (CS)
Zaplatílek K.: MATLAB® pro začínající uživatele. Knihovnicka.cz. Brno: Tribun EU, 2020. ISBN 978-80-263-1589-6. (CS)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme BPC-NCP Bachelor's 2 year of study, summer semester, compulsory

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

prof. Ing. Jan Leuchter, Ph.D.

Syllabus

  1. Parameters and characteristics of semiconductor components
  2. Ways of measuring semiconductor components and identifying their parameters
  3. Automated measurements – hardware, software, SCPI language
  4. LabVIEW - basics of graphic programming
  5. LabVIEW - hardware configuration and contact with the measuring device
  6. LabVIEW - algorithmization and compilation of a program for measuring the V-A characteristics of semiconductor components
  7. LabVIEW - processing and evaluation of measured data
  8. MATLAB – processing of measured values
  9. MATLAB (Instrument Control Toolbox)
  10. MATLAB – processing of measured values
  11. Measurement errors and uncertainties I
  12. Measurement errors and uncertainties II – practical procedures for calculating measurement uncertainty
  13. Automated determination of parameters of semiconductor components 

 

 

 

Exercise in computer lab

13 hod., compulsory

Teacher / Lecturer

prof. Ing. Jan Leuchter, Ph.D.

Syllabus

1. Introduction

2. Parameters and characteristics of semiconductor components

3. Modeling and measurement of V-A characteristics of silicon diode, BJT and MOSFET

4. LabVIEW - basics of graphic programming I

5. LabVIEW - basics of graphic programming II

6. Hardware configuration - contact with the measuring device

7. LabVIEW - building an automated system for identifying semiconductor components

8.  LabVIEW - processing of measured data

9.  MATLAB - processing of measured data

10. Identification and characterization of parameters of semiconductor components

11. MATLAB – building a program for determining measurement uncertainty

12. MATLAB – measurement and determination of measurement uncertainty, including automatic identification of component parameters

13. Summary

 

Laboratory exercise

13 hod., compulsory

Teacher / Lecturer

prof. Ing. Jan Leuchter, Ph.D.

Syllabus

1.  Introduction

2.  Parameters and characteristics of semiconductor components

3.  Modeling and measurement of V-A characteristics of silicon diode, BJT and MOSFET

4.  LabVIEW - basics of graphic programming I

5.  LabVIEW - basics of graphic programming II

6.  Hardware configuration - contact with the measuring device

7.  LabVIEW - building an automated system for identifying semiconductor components

8.  LabVIEW - processing of measured data

9.  MATLAB - processing of measured data

10. Identification and characterization of parameters of semiconductor components

11.  MATLAB – building a program for determining measurement uncertainty

12. MATLAB – measurement and determination of measurement uncertainty, including automatic identification of component parameters

13. Summary