Course detail

Diagnostics and measurements of functional properties of nanostructures

CEITEC VUT-DS102AAcad. year: 2024/2025

Not applicable.

Language of instruction

English

Mode of study

Not applicable.

Guarantor

prof. RNDr. Tomáš Šikola, CSc.

Department

Central European Institute of Technology BUT (CEITEC VUT)

Entry knowledge

Not applicable.

Rules for evaluation and completion of the course

Not applicable.

Aims

Not applicable.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993

Recommended reading

Not applicable.

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

prof. RNDr. Tomáš Šikola, CSc.