Course detail
Diagnostics and measurements of functional properties of nanostructures
CEITEC VUT-DS102AAcad. year: 2024/2025
Not applicable.
Language of instruction
English
Mode of study
Not applicable.
Guarantor
Entry knowledge
Not applicable.
Rules for evaluation and completion of the course
Not applicable.
Aims
Not applicable.
Study aids
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993
Recommended reading
Not applicable.