Course detail
Diagnostics and Testing
FEKT-MPA-DMEAcad. year: 2025/2026
Diagnostic methods for determining properties and parameters of electrical insulating materials and systems. Microscopic, spectroscopic and diffractometric diagnostic methods, physical principles and applications. Diagnostic methods for determining the properties of semiconductor wafers and structures, contamination and defects in semiconductor materials. Processing and evaluation of measured data. Translated with www.DeepL.com/Translator (free version)
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Entry knowledge
Rules for evaluation and completion of the course
up to 60 points from written final exam
Final exam is focused on verification of knowledge and orientation in the field of diagnostics methods and organization of testing.
Obligatory participation in teaching.
Aims
At the end of the course, the student will be able to:
- describe theoretical basis of electrical and physical diagnostics methods used for determination of properties, parameters and composition of electrical materials,
- explain general base of processing and evaluating of measured data,
- describe organization of testing and certification in Czech Republic and in European Union,
- define legislative requirements in the field of metrology,
- be knowledgeable in diagnostics methods, plan usage of suitable method for concrete application, including of simple interpretation of obtained information.
Study aids
Prerequisites and corequisites
Basic literature
Ifan Hughes, Thomas Hase; Measurements and their Uncertainties: A practical guide to modern error analysis; Oxford University Press; 2010 (EN)
OĆonnor, D.J. and others: Surface Analysis Methods in Materials Science. Springer Berlin 2003. ISBN0931-5195 (EN)
Reimer,L.:Scanning electron microscopy,Springer Verlag Berlin,2005 (EN)
Van Zant, P.: Microchip fabrication. Fourth edition. McGraw-Hill Publication. New York, 2000. (EN)
Recommended reading
Classification of course in study plans