Course detail

Methods of Structure Analysis II

FSI-WA2Acad. year: 2025/2026

The subject is a continuation of Methods of structure analysis I and covers the following topics:
Spectroscopic methods for macroscopic chemical composition assessment of solid matter, electron- and probe-microscopy techniques for surface analysis, spectroscopic techniques for thin layer and surface analyses, selected methods of organic matter analysis, tomography and 3D analytical techniques, methods of study of magnetic properties of materials.

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

Ing. Ondřej Man, Ph.D.

Department

Institute of Materials Science and Engineering (ÚMVI)

Entry knowledge

The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of the Bachelor´s degree of mechanical engineering study.

Rules for evaluation and completion of the course

Awarding the course-unit credit is based on evaluated assignments from practical lessons.
Compulsory attendance at practical lessons and excursions. Absence from exercises is dealt with individually.

Aims

To provide an overview (together with the subject Methods of structure analysis I) of analytical techniques that a material specialist can make use of both in practice and research.
The overwiev on microscopy and analytical techniques for industrial practise shall be extended by knowledge of advanced techniques for research and complex issue assessment.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5. (EN)
FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4.ProQuest Ebook Central (EN)
FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3. (CS)
KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8. (CS)
Sardela, M (ed.) 2014, Practical Materials Characterization, Springer New York, New York, NY. Available from: ProQuest Ebook Central. [13 September 2023]. (EN)

Recommended reading

BRIGGS, D. (David) a John T. GRANT. Surface analysis by auger and X-ray photoelectron spectroscopy. Chichester: Manchester: IM Publications ; SurfaceSpectra, 2003, xi, 899 stran : ilustrace, tabulky, grafy. ISBN 1-901019-04-7. (EN)
KAUPP, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin: Springer, 2006, vii, 292 s. : il. ISBN 3-540-28405-2. (EN)
LAJUNEN, Lauri H.J. Spectrochemical Analysis by Atomic Absorption and Emission. Cambridge: The Royal Society of Chemistry, 1992, 241 s. ISBN 0-85186-873-8. (EN)

Classification of course in study plans

  • Programme N-MTI-P Master's 2 year of study, winter semester, compulsory-optional

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

Ing. Ondřej Man, Ph.D.

Syllabus

Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- macroscopic analytical techniques (introduction)
- optical emission spectroscopy (OES)
- atomic absorption spectroscopy (AAS)
- combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons
- secondary ion mass spectroscopy (SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR)
- scanning probe microscopy (STM, AFM, SNOM)
- combined micro- and spectroscopic methods (TERS, SERS)
- advanced X-ray diffraction and scattering techniques (SAXS, GISAXS, X-ray topography, synchrotrons)
- neutron diffraction
- Mössbauer spectroscopy
- measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography
- destructive tomography techniques (3D FIB)

Laboratory exercise

26 hod., compulsory

Teacher / Lecturer

Ing. Ondřej Man, Ph.D.

Syllabus

Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons, secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR), scanning probe microscopy (STM, AFM, SNOM)
- advanced X-ray diffraction and scattering techniques
- Mössbauer spectroscopy, measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography, destructive tomography techniques (3D FIB)