Bachelor's Thesis
Sputtering of nitride layers using Kaufman ion-beam source for bioelectronics applications
Final Thesis 10.88 MBAuthor of thesis: Ing. Jaromír Jarušek
Acad. year: 2021/2022
Supervisor: Ing. Imrich Gablech, Ph.D.
Reviewer: Ing. Ondřej Chmela, Ph.D.
Abstract:In this work, nitride layers, their applications in bioelectronics, and methods of chemical vapour deposition and physical vapour deposition are presented. The focus of this work is the preparation of titanium nitride thin films by reactive sputtering using Kaufman ion-beam sources. Thin films were deposited on silicon wafers and microslides. Deposited titanium nitride thin films are characterized by X-ray diffraction, four-point probe sheet resistance measurement and profilometry to determine residual stress.
titanium nitride, thin films, transparent conductive films, Kaufman ion-beam source, reactive sputtering, characterization, optical transmission, sheet resistance
Date of defence
15.06.2022
Result of the defence
Defended (thesis was successfully defended)
Grading
A
Process of defence
Student seznámil komisi se svou bakalářskou prací. Prezentoval dosažené výsledky a proběhla diskuze na dané téma BP. Následně student zodpověděl všechny otázky oponenta i členů komise.
Language of thesis
Czech
Faculty
Department
Study programme
Microelectronics and Technology (BPC-MET)
Composition of Committee
doc. Ing. Lukáš Fujcik, Ph.D. (předseda)
prof. Ing. Jan Leuchter, Ph.D. (místopředseda)
doc. Ing. Petr Křivík, Ph.D. (člen)
Ing. Imrich Gablech, Ph.D. (člen)
Ing. Alexandr Otáhal, Ph.D. (člen)
Supervisor’s report
Ing. Imrich Gablech, Ph.D.
Grade proposed by supervisor: A
Reviewer’s report
Ing. Ondřej Chmela, Ph.D.
Grade proposed by reviewer: A
File inserted by the reviewer | Size |
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Posudek oponenta [.pdf] | 93,07 kB |