Detail předmětu

Diagnostics and measurements of functional properties of nanostructures

CEITEC VUT-DS102AAk. rok: 2020/2021

The main goal of this PhD course is to give a theoretical and experimental background on the methods for diagnostics of nanostructures available in CEITEC. The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological, chemical and structural parameters, as well as of their local functional properties. Various modes of scanning probe microscopy, electron and ion microscopy (TEM, SEM, etc.), optical spectroscopic microscopy and their combination will be discussed. Most of these methods will be demonstrated and practice on instruments of CEITEC facilities.

Jazyk výuky

angličtina

Garant předmětu

prof. RNDr. Tomáš Šikola, CSc.

Zajišťuje ústav

Středoevropský technologický institut VUT (CEITEC VUT)

Osnovy výuky

1. Scanning Probe Microscopy (SPM) – introduction, principles of design.
2. Scanning Tunneling Microscopy (STM) – principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) – relevant forces and operation modes.
3. Atomic force microscopy (AFM) and magnetic force microscopy (MFM).
4. Electric force microscopy (EFM) and Kelvin force microscopy (KFM).
5. Other types of SPM.
6. Electron microscopy and spectroscopy (TEM/EELS, SEM, SAM, EDX, SEMPA, aj.).
7. Ion microscopy and spectroscopy (FIB/LEIS, SIMS).
8. Photoelectron microscopy (XPS, SR PES, (S)AR XPS).
9. Optical microscopy and spectroscopy - far field methods (reflectivity and ellipsometry, confocal scanning Raman spectroscopy and photoluminiscence, two-photon methods).
10. Optical microscopy and spectroscopy - near field methods (scanning near field optical microscopy - SNOM).
11. Optical microscopy and spectroscopy - combined methods (scanning tunneling luniniscence, cathodoluminiscence, TERS and SERS, etc.).
12. X-ray methods (XRD, XRR, SAXS, GISAXS, XRCD/PEEM microscopy) .

Základní literatura

Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993

Zařazení předmětu ve studijních plánech

  • Program STIAMN doktorský

    obor AM , 1 ročník, zimní semestr, povinně volitelný
    obor ANTMT , 1 ročník, zimní semestr, povinně volitelný