Detail předmětu

Characterization of Surfaces and Thin Films

CEITEC VUT-DS137AAk. rok: 2024/2025

1. Bonds in solids (ionic, covalent, van der Waals, metallic), crystalline and amorphous materials, type of materials (ceramics, glasses, metals, polymers, composites) • 2. Physics at surfaces (surface tension, electronics of surfaces, work function, surface states, thermoemission, adsorption, chemisorption, methods for preparation of clean surfaces) • 3. Interaction of photons with materials and principles of spectroscopic characterization methods (Mössbauer effect, photoeffect, spectrophotometry and ellipsometry, Ramanova spectroscopy, infrared spectroscopy, NMR, EPR) • 4. Interaction of particle beams (electrons, neutrons, ions/atoms) with condensed matter • 5. Electron spectroscopy (electron sources, energy analysers, ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, Auger spectroscopy, spectroscopy of energy losses) • 6. Ion beam methods (ion sources, mass analyzers, Rutherford backscattering spectroscopy - RBS, elastic recoil detection analysis - ERDA, nuclear resonance reaction analysis - NRA, secondary ion mass spectrometry - SIMS, fast atom bombardment - FAB, matrix-assisted laser desorption ionization - MALDI)

 

Jazyk výuky

angličtina

Vstupní znalosti

Basics of quantum mechanics, solid state physics, and optics.

 

Pravidla hodnocení a ukončení předmětu

The course is finished by the colloquium. Requirements for completion:
 - read and understand an English scientific paper focused on thin films or surface characterization,
 - comment and discuss the selected scientific paper in own oral presentation,
 - show the knowledge of the subject in a written test.

 

 

Učební cíle

The course provides a comprehensive overview of physical methods for characterizing surfaces and thin films. By the end of this course, the student will be able to: explain the differences between materials; describe the processes involved in the interaction of electromagnetic radiation or particle beams with materials; make informed decisions about the approach to the analysis of thin films and surfaces in terms of the choice of methods and their sequence.

 

 

Základní literatura

Flewitt, P. E. J. a Wild, R. K. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994. xvi, 517. ISBN 0750303204.