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VYROUBAL, P.
Originální název
The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope.
Klíčová slova
Shock wave, scintilation detector, simulation
Autoři
Rok RIV
2013
Vydáno
18. 11. 2013
ISSN
1802-4564
Periodikum
ElectroScope - http://www.electroscope.zcu.cz
Ročník
Číslo
5
Stát
Česká republika
Strany od
1
Strany do
Strany počet
BibTex
@article{BUT103128, author="Petr {Vyroubal}", title="The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope", journal="ElectroScope - http://www.electroscope.zcu.cz", year="2013", volume="2013", number="5", pages="1--5", issn="1802-4564" }