Detail publikace
Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools
VANĚK, J., CHOBOLA, Z., BAŘINKA, R.
Originální název
Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools
Anglický název
Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
čeština
Originální abstrakt
Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools
Klíčová slova v angličtině
Silar Cell
Autoři
VANĚK, J., CHOBOLA, Z., BAŘINKA, R.
Rok RIV
2002
Vydáno
1. 1. 2002
Nakladatel
Czech Technical University in Praque
Místo
Herbertov
ISBN
80-01-02579-9
Kniha
Proceedings of International Workshop Physical and Maaterial Engineering 2002
Strany od
121
Strany do
122
Strany počet
2
BibTex
@inproceedings{BUT10405,
author="Jiří {Vaněk} and Zdeněk {Chobola} and Radim {Bařinka}",
title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
booktitle="Proceedings of International Workshop Physical and Maaterial Engineering 2002",
year="2002",
pages="2",
publisher="Czech Technical University in Praque",
address="Herbertov",
isbn="80-01-02579-9"
}