Detail publikace

Detection of Edge Structures on Surface of Sedimentary Grains Acquired by Electron Microscope

KŘUPKA, A. ŘÍHA, K.

Originální název

Detection of Edge Structures on Surface of Sedimentary Grains Acquired by Electron Microscope

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper presents a method for edge detection on the surface of sedimentary grains that were acquired by an electron microscope. Local grain parts are described by textural co-occurrence features. Edges are then detected by classification of co-occurrence features corresponding to particular parts of image. For this classification, a logistic regression model is used. The precision and recall values of the cross-validated model are 82% and 77% respectively. Further, a measure that quantifies a maximal edge length detected on a grain is proposed. The purpose of this measure is to provide a high-level feature for comparing different grain sets. To evaluate a usability of the measure, the measure is computed for sets of grains of different geomorphological geneses and the differences are compared. Because the results showed a specific measure range for some geneses, the proposed edge detection method can be considered as useful for description of sedimentary grains.

Klíčová slova

Edge structure, co-occurrence matrix, logistic regression model, sedimentary grains, edge length

Autoři

KŘUPKA, A.; ŘÍHA, K.

Rok RIV

2014

Vydáno

9. 7. 2015

Místo

Berlin, Germany

ISBN

978-1-4799-8497-8

Kniha

Proceedings of the 38th International Conference on Telecommunication and Signal Processing

Strany od

785

Strany do

788

Strany počet

4

URL

https://ieeexplore.ieee.org/document/7296373

BibTex

@inproceedings{BUT109404,
  author="Aleš {Křupka} and Kamil {Říha}",
  title="Detection of Edge Structures on Surface of Sedimentary Grains Acquired by Electron Microscope",
  booktitle="Proceedings of the 38th International Conference on Telecommunication and Signal Processing",
  year="2015",
  pages="785--788",
  address="Berlin, Germany",
  doi="10.1109/TSP.2015.7296373",
  isbn="978-1-4799-8497-8",
  url="https://ieeexplore.ieee.org/document/7296373"
}