Detail publikace

The Comparison between Noise Spectroscopy and LBIC

VANĚK, J., BRZOKOUPIL, V., VAŠÍČEK, T., KAZELLE, J., CHOBOLA, Z., BAŘINKA, R.

Originální název

The Comparison between Noise Spectroscopy and LBIC

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixed conditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.

Klíčová slova

LBIC, noise, spectroscopy, non-destructive, solar

Autoři

VANĚK, J., BRZOKOUPIL, V., VAŠÍČEK, T., KAZELLE, J., CHOBOLA, Z., BAŘINKA, R.

Rok RIV

2004

Vydáno

1. 1. 2004

Nakladatel

MSD

Místo

Brno

ISBN

80-214-2701-9

Kniha

The 11th Electronic Devices and Systems Conference

Strany od

454

Strany do

457

Strany počet

4

BibTex

@inproceedings{BUT11200,
  author="Jiří {Vaněk} and Vladimír {Brzokoupil} and Tomáš {Vašíček} and Jiří {Kazelle} and Zdeněk {Chobola} and Radim {Bařinka}",
  title="The Comparison between Noise Spectroscopy and LBIC",
  booktitle="The 11th Electronic Devices and Systems Conference",
  year="2004",
  pages="4",
  publisher="MSD",
  address="Brno",
  isbn="80-214-2701-9"
}