Detail publikace

Very low energy scanning transmission electron microscopy

HRNČIŘÍK, P., MULLEROVÁ, I.

Originální název

Very low energy scanning transmission electron microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Combined SLEEM/scanning low energy transmission electron microscope (SLETEM) uses a cathode lens to decelerate the electron beam just in front of the specimen surface, and is able to reach a resolution of a few nm even at a landing energy of a few eV. This provides the flexibility to investigate the transmission of electrons through thin samples at electron energies as low as 1 eV.

Klíčová slova

SLETEM, SLEEM, IMFP, SEM,

Autoři

HRNČIŘÍK, P., MULLEROVÁ, I.

Vydáno

1. 1. 2004

Nakladatel

EMC 2004

Místo

Antwerpy, Belgie

Strany od

P02

Strany počet

2