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CHMELA, O. HUBÁLEK, J.
Originální název
Different imaging techniques for investigation of treatment effects on various substrate surfaces
Typ
konferenční sborník (ne článek)
Jazyk
angličtina
Originální abstrakt
The different imaging techniques were used for measurement of the properties changes on substrate surfaces. In this paper we report about testing various treatment on different sub-strates following investigation and characterization of the advantages/disadvantages of these methods for future applications. We usually used flexible materials such as polyethylene terephthalate (PET) and poly-carbonate (PC) for treatment. We also used glass substrate and aluminum oxide (Al2O3) to determine the efficiency of oxide plasma etching. As imaging techniques mainly atomic force microscopy (AFM), scanning electron microscopy (SEM), contact angle measurement and a special method for examination of layer adhesion known as a scratch test were used.
Klíčová slova
substrate treatment, cleaning, AFM, oxide plasma, contact angle, SEM
Autoři
CHMELA, O.; HUBÁLEK, J.
Vydáno
23. 4. 2015
Nakladatel
VUT v Brně, FEKT
Místo
Brno
ISBN
978-80-214-5148-3
Kniha
Proceedings of the 21st Conference STUDENT EEICT 2015
Edice
1
Číslo edice
ISSN
NEUVEDENO
Strany od
351
Strany do
355
Strany počet
5
URL
http://www.feec.vutbr.cz/EEICT/?page_id=12
BibTex
@proceedings{BUT114292, editor="Ondřej {Chmela} and Jaromír {Hubálek}", title="Different imaging techniques for investigation of treatment effects on various substrate surfaces", year="2015", series="1", number="1", pages="351--355", publisher="VUT v Brně, FEKT", address="Brno", isbn="978-80-214-5148-3", url="http://www.feec.vutbr.cz/EEICT/?page_id=12" }