Detail publikace

Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop

ŠOTNER, R. JEŘÁBEK, J. HERENCSÁR, N. VRBA, K. LAHIRI, A. DOSTÁL, T.

Originální název

Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The paper deals with precise analysis of simple AC variable gain CMOS amplifier. The circuit can be used as a simple voltage follower (6 MOS transistors are required) or amplifier. The main attention of this work is focused on a small-signal model of the proposed block and effects of additional passive network leading to compensation of its instability. The continuous gain adjusting in range from 1.1 to 10 (0.8 – 20 dB and with bandwidth 4.9 - 90 MHz at 5 pF load capacitance) is possible and the proposed amplifier is suitable for implementation in systems, where lower range of gain adjusting and large dynamical range is required. Theoretical analyses are supported by PSpice simulations (TSMC 0.18 um technological models) and experimental measurements with commercially available CMOS transistor fields (ALD1106/7) also confirm the discussed behavior of the amplifier.

Klíčová slova

Active elements, instability compensation, variable gain amplifier, voltage buffer, voltage follower, voltage gain adjusting.

Autoři

ŠOTNER, R.; JEŘÁBEK, J.; HERENCSÁR, N.; VRBA, K.; LAHIRI, A.; DOSTÁL, T.

Rok RIV

2015

Vydáno

6. 7. 2015

Nakladatel

De Gruyter Open

ISSN

1335-8871

Periodikum

Measurement Science Review

Ročník

15

Číslo

3

Stát

Slovenská republika

Strany od

139

Strany do

151

Strany počet

13

URL

Plný text v Digitální knihovně

BibTex

@article{BUT115199,
  author="Roman {Šotner} and Jan {Jeřábek} and Norbert {Herencsár} and Kamil {Vrba} and Abhirup {Lahiri} and Tomáš {Dostál}",
  title="Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop",
  journal="Measurement Science Review",
  year="2015",
  volume="15",
  number="3",
  pages="139--151",
  doi="10.1515/msr-2015-0021",
  issn="1335-8871",
  url="http://www.degruyter.com/view/j/msr.2015.15.issue-3/msr-2015-0021/msr-2015-0021.xml?format=INT"
}