Detail publikace

Noise Spectroscopy of Nano- and Microscopic Periodic Material Structures

NASSWETTROVÁ, A. DREXLER, P. SEGIŇÁK, J. NEŠPOR, D. FRIEDL, M. MARCOŇ, P. FIALA, P.

Originální název

Noise Spectroscopy of Nano- and Microscopic Periodic Material Structures

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The authors discuss the application of a broadband noise signal in the research of periodic structures and present the basic testing related to the described problem. Generally, noise spectroscopy tests are carried out to verify the behaviour of the response of periodic structures, and the related objective consists in recording the properties of microscopic structures in natural and artificial materials. The aim is to find a metrological method to investigate structures and materials in the frequency range between 100 MHz and 10 GHz; this paper therefore characterizes the design of a suitable measuring technique based on noise spectroscopy and introduces the first tests conducted on a periodic structure. In this context, the applied instrumentation is also shown to complement the underlying theoretical analysis.

Klíčová slova

Nanomaterials; periodic structures; noise; noise spectroscopy; nanomaterials; microscopic structures

Autoři

NASSWETTROVÁ, A.; DREXLER, P.; SEGIŇÁK, J.; NEŠPOR, D.; FRIEDL, M.; MARCOŇ, P.; FIALA, P.

Rok RIV

2015

Vydáno

4. 5. 2015

Nakladatel

SPIE-INT SOC OPTICAL ENGINEERING

Místo

BELLINGHAM, WA 98227-0010 USA

ISBN

978-1-62841-639-8

Kniha

Proceedings of SPIE

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Stát

Spojené státy americké

Strany od

1

Strany do

10

Strany počet

10

BibTex

@inproceedings{BUT115601,
  author="Andrea {Nasswettrová} and Petr {Drexler} and Ján {Segiňák} and Dušan {Nešpor} and Martin {Friedl} and Petr {Marcoň} and Pavel {Fiala}",
  title="Noise Spectroscopy of Nano- and Microscopic Periodic Material Structures",
  booktitle="Proceedings of SPIE",
  year="2015",
  journal="Proceedings of SPIE",
  pages="1--10",
  publisher="SPIE-INT SOC OPTICAL ENGINEERING",
  address="BELLINGHAM, WA 98227-0010 USA",
  doi="10.1117/12.2177798",
  isbn="978-1-62841-639-8",
  issn="0277-786X"
}