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VANĚK, J. CHOBOLA, Z. LUŇÁK, M.
Originální název
Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper deals with comparisons of noise spectroscopy, I-V characteristic and microplasma detection of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generation-recombination types. G-R noise and burst noise is not fundamental noise and therefore can by use as a quality indicator.
Klíčová slova
photovoltaic cell, concentrator, noise spectroscopy, microplasma
Autoři
VANĚK, J.; CHOBOLA, Z.; LUŇÁK, M.
Rok RIV
2015
Vydáno
30. 8. 2015
Nakladatel
Brno University of Technology
Místo
Brno
ISBN
978-80-214-5109-4
Kniha
16th ABAF International Conference proceeding
Edice
1
Číslo edice
Strany od
144
Strany do
146
Strany počet
3
URL
http://www.aba-brno.cz/
BibTex
@inproceedings{BUT117606, author="Jiří {Vaněk} and Zdeněk {Chobola} and Miroslav {Luňák}", title="Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency", booktitle="16th ABAF International Conference proceeding", year="2015", series="1", number="1", pages="144--146", publisher="Brno University of Technology", address="Brno", isbn="978-80-214-5109-4", url="http://www.aba-brno.cz/" }