Detail publikace

Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

VANĚK, J. CHOBOLA, Z. LUŇÁK, M.

Originální název

Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with comparisons of noise spectroscopy, I-V characteristic and microplasma detection of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generation-recombination types. G-R noise and burst noise is not fundamental noise and therefore can by use as a quality indicator.

Klíčová slova

photovoltaic cell, concentrator, noise spectroscopy, microplasma

Autoři

VANĚK, J.; CHOBOLA, Z.; LUŇÁK, M.

Rok RIV

2015

Vydáno

10. 12. 2015

Nakladatel

ECS Transaction

Místo

USA

ISBN

978-80-214-5109-4

Kniha

ECS Trans. 2015 70(1)

ISSN

1938-5862

Periodikum

ECS Transactions

Ročník

70

Číslo

1

Stát

Spojené státy americké

Strany od

245

Strany do

253

Strany počet

8

BibTex

@inproceedings{BUT120033,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Miroslav {Luňák}",
  title="Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With
Very High Efficiency",
  booktitle="ECS Trans. 2015 70(1)",
  year="2015",
  journal="ECS Transactions",
  volume="70",
  number="1",
  pages="245--253",
  publisher="ECS Transaction",
  address="USA",
  doi="10.1149/07001.0245ecst",
  isbn="978-80-214-5109-4",
  issn="1938-5862"
}