Detail publikace

Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods

ŠKVARENINA, Ľ.

Originální název

Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper discusses the application of a variety diagnostic methods applicable to the solar cells. More objective results about solar cells quality and reliability are possible to obtain by using a various methods. Diagnostic methods described in this paper are based on a dark and illuminated J–V characteristics, a investigation of noise in a wide range of frequency and a radiation detection at a di erent spectral range, namely by an electroluminescence and a thermography method. These methods are primarily more appropriate for a detection or a localization of microstructure defects when a reverse-bias stress is applied. However, the analysis of a forward-bias conditions is included in an investigation of J–V characteristics as well.

Klíčová slova

Solar Cells, J–V curve, Noise, Electroluminescence, Thermal Imaging, Defects

Autoři

ŠKVARENINA, Ľ.

Vydáno

28. 4. 2016

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních

Místo

Brno

ISBN

978-80-214-5350-0

Kniha

Proceedings of the 22nd Conference STUDENT EEICT 2016

Číslo edice

1.

Strany od

743

Strany do

747

Strany počet

777

URL

http://www.feec.vutbr.cz/EEICT/2016/sbornik/EEICT-2016-sborník-komplet.pdf

BibTex

@inproceedings{BUT124461,
  author="Ľubomír {Škvarenina}",
  title="Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods",
  booktitle="Proceedings of the 22nd Conference STUDENT EEICT 2016",
  year="2016",
  number="1.",
  pages="743--747",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
  address="Brno",
  isbn="978-80-214-5350-0",
  url="http://www.feec.vutbr.cz/EEICT/2016/sbornik/EEICT-2016-sborník-komplet.pdf"
}