Detail publikace

Subtreshold voltage-induced transferred charge aging analysis of alternating-current thin-film electroluminescent device

AHMED, M.

Originální název

Subtreshold voltage-induced transferred charge aging analysis of alternating-current thin-film electroluminescent device

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper brings a subthreshold voltage-induced transferred charge (VIQ) analysis. This method is a useful technique for investigating subtle device physics electrical operation and the aging behavior of ACTFEL devices. Some results will be presented.

Klíčová slova

ACTFEL, voltage-induced transferred charge, subthreshold, aging, analysis

Autoři

AHMED, M.

Rok RIV

2004

Vydáno

11. 11. 2004

Nakladatel

Ing. Zdenek Novotny, CSc.

Místo

Brno

ISBN

80-7355-024-5

Kniha

New trends in Physics NTF 2004

Strany od

196

Strany do

199

Strany počet

4

BibTex

@inproceedings{BUT12615,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Subtreshold voltage-induced transferred charge aging analysis of alternating-current thin-film electroluminescent device",
  booktitle="New trends in Physics NTF 2004",
  year="2004",
  pages="196--199",
  publisher="Ing. Zdenek Novotny, CSc.",
  address="Brno",
  isbn="80-7355-024-5"
}