Detail publikace

Application of electrical measurements to investigation of solar cell microstructure defects

ŠKVARENINA, Ľ. MACKŮ, R.

Originální název

Application of electrical measurements to investigation of solar cell microstructure defects

Typ

článek v časopise ve Scopus, Jsc

Jazyk

angličtina

Originální abstrakt

The research is aimed to the investigation of the microstructure defects in the silicon and the thin-film CIGS solar cells. These defects have their origin mainly in the technological process of a production but they can be caused by an accidental mechanical stress during a normal operation, too. That leads to a formation of the micro-cracks and the fractures, which have a significant effect on a device efficiency and reliability. The reverse-bias conditions are usually used for the defects characterization purposes. The mechanical induced defects increase a reverse current which leads to a strong overheating in the local breakdowns and the surroundings areas, thus for the defects localization purposes an infrared imaging and an electroluminescence method is used. Beyond these commonly used methods the results from the electrical current noise fluctuations observed in a frequency domain are presented in this work. The noise fluctuations measurement is a reliable indicator of a device quality and allow us to qualify the device damage extent. Using combination of these methods it is possible to localize the particular defects, assess the degree of a damage and classify the elimination process of the particular defects.

Klíčová slova

Solar Cell, Local Defects, Fractures, Electroluminescence, Noise

Autoři

ŠKVARENINA, Ľ.; MACKŮ, R.

Vydáno

2. 1. 2017

Nakladatel

Trans Tech Publications

Místo

Switzerland

ISSN

1662-9779

Periodikum

Solid State Phenomena

Ročník

258

Číslo

8

Stát

Švýcarská konfederace

Strany od

473

Strany do

476

Strany počet

672

URL

http://www.scientific.net/SSP.258.473

BibTex

@article{BUT130347,
  author="Ľubomír {Škvarenina} and Robert {Macků}",
  title="Application of electrical measurements to investigation of solar cell microstructure defects",
  journal="Solid State Phenomena",
  year="2017",
  volume="258",
  number="8",
  pages="473--476",
  doi="10.4028/www.scientific.net/SSP.258.473",
  issn="1662-9779",
  url="http://www.scientific.net/SSP.258.473"
}