Detail publikace

Regression Test Suites Optimization for Application-specific Instruction-set Processors and Their Use for Dependability Analysis

ZACHARIÁŠOVÁ, M. KEKELYOVÁ, M. KOTÁSEK, Z.

Originální název

Regression Test Suites Optimization for Application-specific Instruction-set Processors and Their Use for Dependability Analysis

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Nowadays, Application-specific Instruction-set Processors
(ASIPs) are an important part of embedded systems,
especially those which are utilized in Internet of Things (IoT).
They can be optimized for high performance, small area or
low power consumption by changes in their instruction set or
by various changes in their hardware architecture. With fast
prototyping of ASIPs, another very important issue arises. It
is fast verification of such changes, ideally with optimized test
suites, so comprehensive and long-running verification after every
change can be avoided. In this paper, a new technique for
building optimized regression suites for ASIPs is proposed which
is based on the genetic algorithm. Experiments show that using
this technique, reduction of the original test suite from first phase
verification is significant, the new optimized regression
suite remains strong in checking key functionality of an ASIP and
a considerable improvement in the verification runtime can be
achieved. Moreover, the paper shows a proposal of multi-domain
application of the regression suites in evaluating dependability
of FPGA-based ASIP prototypes.

Klíčová slova

verification, dependability, regression tests

Autoři

ZACHARIÁŠOVÁ, M.; KEKELYOVÁ, M.; KOTÁSEK, Z.

Vydáno

31. 7. 2016

Nakladatel

IEEE Computer Society

Místo

Limassol Cyprus

ISBN

978-1-5090-2816-0

Kniha

Proceedings of the 19th Euromicro Conference on Digital Systems Design

Strany od

380

Strany do

387

Strany počet

8

BibTex

@inproceedings{BUT130972,
  author="Marcela {Zachariášová} and Michaela {Belešová} and Zdeněk {Kotásek}",
  title="Regression Test Suites Optimization for Application-specific Instruction-set Processors and Their Use for Dependability Analysis",
  booktitle="Proceedings of the 19th Euromicro Conference on Digital Systems Design",
  year="2016",
  pages="380--387",
  publisher="IEEE Computer Society",
  address="Limassol Cyprus",
  doi="10.1109/DSD.2016.50",
  isbn="978-1-5090-2816-0"
}