Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
STODŮLKA, J. MATĚJKA, L. ŠAFÁŘOVÁ, M.
Originální název
Analysis of the Causes of Defects due to Quality Roofing Membranes Mechanical Anchoring
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Anchoring of the layers of flat warm roofs using anchoring elements is nowadays one of the most used technology. This is a frequent technology to repair damaged roofs (total reconstruction, increasing the load on the wind loads, partial repairs etc.). In the European building market there are several suppliers of the enchoring equipment who declare their product's properties in the european technical approvements (ETA). The goal of the article is to demonstrate results of the carried out measurements and their possible impact into practical application of the mechanically anchored systems. This allows reduce the amount of defects to improving flexible watertight membranes. The topic can be considered actual and due to the large number of defects precisely for these types of roofs.
Klíčová slova
Fatener, MEFAWAME
Autoři
STODŮLKA, J.; MATĚJKA, L.; ŠAFÁŘOVÁ, M.
Vydáno
24. 1. 2017
Nakladatel
EDP Sciences
Místo
EDP France
ISBN
978-2-7598-9012-5
Kniha
Building defects
ISSN
2261-236X
Periodikum
MATEC Web of Conferences
Ročník
93
Stát
Francouzská republika
Strany od
1
Strany do
6
Strany počet
URL
https://www.matec-conferences.org/articles/matecconf/abs/2017/07/matecconf_bd2017_01007/matecconf_bd2017_01007.html
Plný text v Digitální knihovně
http://hdl.handle.net/11012/196420
BibTex
@inproceedings{BUT132517, author="Jindřich {Stodůlka} and Markéta {Šafářová} and Libor {Matějka}", title="Analysis of the Causes of Defects due to Quality Roofing Membranes Mechanical Anchoring", booktitle="Building defects", year="2017", journal="MATEC Web of Conferences", volume="93", pages="1--6", publisher="EDP Sciences", address="EDP France", doi="10.1051/matecconf/20179301007", isbn="978-2-7598-9012-5", issn="2261-236X", url="https://www.matec-conferences.org/articles/matecconf/abs/2017/07/matecconf_bd2017_01007/matecconf_bd2017_01007.html" }