Detail publikace

Electroluminescence and Thermal Imaging of Defects in Thin-film Chalcopyrite Solar Cells

ŠKVARENINA, Ľ.

Originální název

Electroluminescence and Thermal Imaging of Defects in Thin-film Chalcopyrite Solar Cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Thin-film chalcopyrite based Cu(In,Ga)Se2 solar cells with a metal wrap through interconnection were investigated by non-destructive methods in our research. The primary focus of this investigationwasadetectionandalocalizationofmicrostructuraldefectsinthistypeofCu(In,Ga)Se2 solarcells. Acombinationofavisibleandnearinfraredelectroluminescencewithalock-inthermography was used for these purposes. Mainly the electroluminescence was a very sensitive tool for an indication of pre-breakdown sites influenced by a trap-assisted tunneling or stress-induced leakage currents. A strong correlation between electroluminescence maps and lock-in thermograms was obtained after a local breakdown accompanied by a creation of permanent defect.

Klíčová slova

thin-film, CIGS, IR lock-in, electroluminescence, metal wrap through

Autoři

ŠKVARENINA, Ľ.

Vydáno

27. 4. 2017

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Místo

Brno

ISBN

978-80-214-5496-5

Kniha

Proceedings of the 23rd Conference STUDENT EEICT 2017

Číslo edice

1

Strany od

690

Strany do

694

Strany počet

694

URL

http://www.utee.feec.vutbr.cz/eeict/2017/EEICT%202017-sborník-komplet.pdf

BibTex

@inproceedings{BUT135344,
  author="Ľubomír {Škvarenina}",
  title="Electroluminescence and Thermal Imaging of Defects in Thin-film Chalcopyrite Solar Cells",
  booktitle="Proceedings of the 23rd Conference STUDENT EEICT 2017",
  year="2017",
  number="1",
  pages="690--694",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  address="Brno",
  isbn="978-80-214-5496-5",
  url="http://www.utee.feec.vutbr.cz/eeict/2017/EEICT%202017-sborník-komplet.pdf"
}