Detail publikace

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

DVOŘÁK, P. ÉDES, Z. KVAPIL, M. ŠAMOŘIL, T. LIGMAJER, F. HRTOŇ, M. KALOUSEK, R. KŘÁPEK, V. DUB, P. SPOUSTA, J. VARGA, P. ŠIKOLA, T.

Originální název

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.

Klíčová slova

plasmonics ; components ; spectroscopy ; interferometric imaging

Autoři

DVOŘÁK, P.; ÉDES, Z.; KVAPIL, M.; ŠAMOŘIL, T.; LIGMAJER, F.; HRTOŇ, M.; KALOUSEK, R.; KŘÁPEK, V.; DUB, P.; SPOUSTA, J.; VARGA, P.; ŠIKOLA, T.

Vydáno

5. 7. 2017

Nakladatel

Optical Society of America

ISSN

1094-4087

Periodikum

OPTICS EXPRESS

Ročník

25

Číslo

14

Stát

Spojené státy americké

Strany od

16560

Strany do

16573

Strany počet

13

URL

https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005

Plný text v Digitální knihovně

http://hdl.handle.net/11012/84174

BibTex

@article{BUT135516,
  author="Petr {Viewegh} and Zoltán {Édes} and Michal {Kvapil} and Tomáš {Šamořil} and Filip {Ligmajer} and Martin {Hrtoň} and Radek {Kalousek} and Vlastimil {Křápek} and Petr {Dub} and Jiří {Spousta} and Peter {Varga} and Tomáš {Šikola}",
  title="Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state",
  journal="OPTICS EXPRESS",
  year="2017",
  volume="25",
  number="14",
  pages="16560--16573",
  doi="10.1364/OE.25.016560",
  issn="1094-4087",
  url="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005"
}