Detail publikace

Coexistence of LTE and WLAN in the ISM Band

MIKLÁŠ, M.

Originální název

Coexistence of LTE and WLAN in the ISM Band

Anglický název

Coexistence of LTE and WLAN in the ISM Band

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

This paper deals with definition, description and measurement of coexistence scenarios, which can occur between LTE and IEEE 802.11g wireless communication systems in the ISM 2.4 GHz band. There are defined common RF frequency bands for both systems and coexistence scenarios which can arise between them. An appropriate measurement workplace and setup is proposed to measure the interaction between LTE and IEEE 802.11g. The rightness of the proposed measurement setup is verified by experimental laboratory measurements.

Anglický abstrakt

This paper deals with definition, description and measurement of coexistence scenarios, which can occur between LTE and IEEE 802.11g wireless communication systems in the ISM 2.4 GHz band. There are defined common RF frequency bands for both systems and coexistence scenarios which can arise between them. An appropriate measurement workplace and setup is proposed to measure the interaction between LTE and IEEE 802.11g. The rightness of the proposed measurement setup is verified by experimental laboratory measurements.

Klíčová slova

LTE, WLAN, Wi-Fi, 5G, ISM band, coexistence, RF measurement, EVM

Klíčová slova v angličtině

LTE, WLAN, Wi-Fi, 5G, ISM band, coexistence, RF measurement, EVM

Autoři

MIKLÁŠ, M.

Vydáno

2. 5. 2017

Nakladatel

VUT

Místo

Brno, Czech Republic

ISBN

978-80-214-5496-5

Kniha

Proceedings of the 23rd Conference STUDENT EEICT 2017

Číslo edice

1

Strany od

34

Strany do

36

Strany počet

3

BibTex

@inproceedings{BUT136100,
  author="Michal {Mikláš}",
  title="Coexistence of LTE and WLAN in the ISM Band",
  booktitle="Proceedings of the 23rd Conference STUDENT EEICT 2017",
  year="2017",
  number="1",
  pages="34--36",
  publisher="VUT",
  address="Brno, Czech Republic",
  isbn="978-80-214-5496-5"
}