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KNOBLOCH, J. MARTIŠ, J. CIPÍN, R. NOUMAN, Z.
Originální název
Test Stand for Obtaining Power Transistors Switching Characteristics During Aging
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper aims to construction, control and implemented measurement method of laboratory stand in order to acquire insulated gate bipolar transistor transients. The transients waveforms are consequently used to obtain indicators of the transistor age. The lifetime tests of an insulated gate bipolar transistor are introduced. Consequently, a novel architecture of measuring stand in order to provide lifetime tests is designed. Also the control algorithm is presented. A fundamental part of this work is a method of measuring switching waveforms including a high frequency current. Acquired waveforms of transistor switching are presented. Finally, the trend of chosen aging indicator values was obtained from the acquired data. Namely the influence of aging on turn--off time was observed.
Klíčová slova
aging; IGBT; collector current measurement; failure indicator; switching characteristic.
Autoři
KNOBLOCH, J.; MARTIŠ, J.; CIPÍN, R.; NOUMAN, Z.
Vydáno
7. 6. 2017
Místo
Milán, Italská republika
ISBN
978-1-5386-3916-0
Kniha
Conference Proceedings 2017 IEEE International Conference on Environment and Electrical Engineering and 2017 IEEE Industrial and Commercial Power Systems Europe
Číslo edice
1
Strany od
393
Strany do
397
Strany počet
5
URL
https://ieeexplore.ieee.org/document/7977460
BibTex
@inproceedings{BUT137073, author="Jan {Knobloch} and Jan {Martiš} and Radoslav {Cipín} and Ziad {Nouman}", title="Test Stand for Obtaining Power Transistors Switching Characteristics During Aging", booktitle="Conference Proceedings 2017 IEEE International Conference on Environment and Electrical Engineering and 2017 IEEE Industrial and Commercial Power Systems Europe", year="2017", number="1", pages="393--397", address="Milán, Italská republika", doi="10.1109/EEEIC.2017.7977460", isbn="978-1-5386-3916-0", url="https://ieeexplore.ieee.org/document/7977460" }