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GAJDOŠ, A. ŠKVARENINA, Ľ. ŠKARVADA, P. MACKŮ, R.
Originální název
Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
An imperfections or defects may appear in fabricated monocrystalline solar cells. These microstructural imperfections could have impact on the parameters of whole solar cell. The research is divided into two parts, firstly, the detection and localization defects by using several techniques including current-voltage measurement, scanning probe microscopy (SPM), scanning electron microscope (SEM) and electroluminescence. Secondly, the defects isolation by a focused ion beam (FIB) milling and impact of a milling process on solar cells. The defect detection is realized by I-V measurement under reverse biased sample. For purpose of localization, advantage of the fact that defects or imperfections in silicon solar cells emit the visible and near infrared electroluminescence under reverse biased voltage is taken, and CCD camera measurement for macroscopic localization of these spots is applied. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. Defect isolation is performed by a SEM equipped with the FIB instrument. FIB uses a beam of gallium ions which modifies crystal structure of a material and may affect parameters of solar cell. As a result, it is interesting that current in reverse biased sample with isolated defect is smaller approximately by 2 orders than current before isolation process.
Klíčová slova
Silicon, solar cell, focused ion beam, I-V curve, SEM, SNOM
Autoři
GAJDOŠ, A.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; MACKŮ, R.
Vydáno
1. 12. 2017
Nakladatel
SPIE
Místo
Bellingham, Washington 98227-0010 USA
ISBN
9781510617025
Kniha
Photonics, Devices, and Systems VII
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
10603
Stát
Spojené státy americké
Strany od
1
Strany do
6
Strany počet
URL
http://dx.doi.org/10.1117/12.2292711
BibTex
@inproceedings{BUT142318, author="Adam {Gajdoš} and Ľubomír {Škvarenina} and Pavel {Škarvada} and Robert {Macků}", title="Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells", booktitle="Photonics, Devices, and Systems VII", year="2017", journal="Proceedings of SPIE", volume="10603", pages="1--6", publisher="SPIE", address="Bellingham, Washington 98227-0010 USA", doi="10.1117/12.2292711", isbn="9781510617025", issn="0277-786X", url="http://dx.doi.org/10.1117/12.2292711" }