Detail publikace

On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking

STRNADEL, J.

Originální název

On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The problem of dependability assessment can be solved analytically just under predefined conditions. If they do not hold, alternative approaches must apply. Widely, they rely on the Monte Carlo simulation, suffering by the high computational complexity. Some rest on further instruments such as probabilistic timed automata that have been shown to be efficient to solve problems in various areas. However, more general as well as precise and faster instruments such as stochastic timed automata (STA) and statistical model checking (SMC) are available for the same purpose the moment. In the paper, basic terms and principles behind the construction of reliability models and dependability assessment on the STA/SMC basis are summarized, followed by a demonstration of their practical applicability in the area of non-repairable systems. Our main goal is to show that, instruments of STA/SMC can facilitate the dependability assessment process even in adverse conditions such as presence of multiple faults of various parameters.

Klíčová slova

fault tolerant system, dependability, assessment, reliability model, simulation, fault, failure, rate, fault tolerant, stochastic timed automaton, statistical model checking, triple modular redundancy, UPPAAL SMC

Autoři

STRNADEL, J.

Vydáno

30. 8. 2017

Nakladatel

IEEE Computer Society

Místo

Los Alamitos

ISBN

978-1-5386-2146-2

Kniha

Proceedings of the 2017 20th Euromicro Conference on Digital System Design

Strany od

352

Strany do

355

Strany počet

4

URL

https://www.fit.vut.cz/research/publication/11365/

BibTex

@inproceedings{BUT144417,
  author="Josef {Strnadel}",
  title="On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking",
  booktitle="Proceedings of the 2017 20th Euromicro Conference on Digital System Design",
  year="2017",
  pages="352--355",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  doi="10.1109/DSD.2017.12",
  isbn="978-1-5386-2146-2",
  url="https://www.fit.vut.cz/research/publication/11365/"
}