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Detail publikace
LOJDA, J. PODIVÍNSKÝ, J. KOTÁSEK, Z.
Originální název
Redundant Data Types and Operations in HLS and their Use for a Robot Controller Unit Fault Tolerance Evaluation
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Some environments (e.g. space, aerospace or medical systems) require electronic systems to withstand an increased occurrence of faults. Moreover, the failure of these electronic systems can cause high economical losses or endanger human health. Fault tolerance is one of the techniques, the goal of which is to avoid such situations. This paper presents an approach to evaluate the degree of importance of individual system partitions when High-Level Synthesis (HLS) methodology is used. The importance of individual partitions was evaluated by the usage of our approach to fault-tolerant data-paths design which is based on the HLS input specification modification. The partitions are formed by sets of variables and operations. A brief description of the approach to fault tolerance in HLS is shown in the paper as well. Our experiments are evaluated using an SRAM-based FPGA evaluation platform which allows us to analyze fault tolerance properties of the Design Under Test (DUT). In the evaluation platform, functional verification in combination with fault injection is utilized.
Klíčová slova
High-Level Synthesis, Redundant Data Type, Redundant Operation, Data-Path, CatapultC, Fault Tolerance, Robot Controller, C++
Autoři
LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z.
Vydáno
29. 9. 2017
Nakladatel
IEEE Computer Society
Místo
Novi Sad
ISBN
978-1-5386-3299-4
Kniha
Proceedings of IEEE East-West Design & Test Symposium
Strany od
359
Strany do
364
Strany počet
6
URL
https://www.fit.vut.cz/research/publication/11493/
BibTex
@inproceedings{BUT144465, author="Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}", title="Redundant Data Types and Operations in HLS and their Use for a Robot Controller Unit Fault Tolerance Evaluation", booktitle="Proceedings of IEEE East-West Design & Test Symposium", year="2017", pages="359--364", publisher="IEEE Computer Society", address="Novi Sad", doi="10.1109/EWDTS.2017.8110127", isbn="978-1-5386-3299-4", url="https://www.fit.vut.cz/research/publication/11493/" }