Detail publikace

On-the-Fly Fast X-Ray Tomography Using a CdTe Pixelated Detector – Application in Mechanical Testing

KUMPOVÁ, I. VOPÁLENSKÝ, M. FÍLA, T. KYTÝŘ, D. VAVŘÍK, D. PICHOTKA, M. JAKŮBEK, J. KERŠNER, Z. KLON, J. SEITL, S. SOBEK, J.

Originální název

On-the-Fly Fast X-Ray Tomography Using a CdTe Pixelated Detector – Application in Mechanical Testing

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Fast tomography measurements are still done almost exclusively within the domain of synchrotrons. However, recent progress in radio diagnostic instrumentation has enabled researchers to perform time-lapse computed tomography (4D-CT) even under laboratory conditions with standard X-Ray sources. Thus, fast time-dependent processes within materials with relatively high X-Ray attenuation can be monitored. The article describes the in-situ tomographic monitoring of crack formation and propagation in a quasi-brittle silicate matrix composite subjected to three point bending. A three-dimensional CT volume containing the region of interest (ROI) in the specimen is imaged over a period of time while the continuously increasing load causes crack initiation and propagation, creating a dynamic volume dataset. An acquisition time of 50 seconds for one full angle tomography with 400 projections makes this tomographic system one of the fastest systems in the world. The resulting visualizations provide qualitative information concerning progressive crack propagation within areas of lower material density. Differential images then allow displaying the spatial orientation of the crack over time. The results were further processed for a quantitative analysis of image quality using various methods of beam hardening correction.

Klíčová slova

Cadmium telluride (CdTe) detectors, fracture mechanics, material characterization, mechanical testing, quasi-brittle material, X-ray imaging techniques, X-ray instrumentation, X-ray tomography

Autoři

KUMPOVÁ, I.; VOPÁLENSKÝ, M.; FÍLA, T.; KYTÝŘ, D.; VAVŘÍK, D.; PICHOTKA, M.; JAKŮBEK, J.; KERŠNER, Z.; KLON, J.; SEITL, S.; SOBEK, J.

Vydáno

12. 12. 2018

ISSN

0018-9499

Periodikum

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Ročník

65

Číslo

12

Stát

Spojené státy americké

Strany od

2870

Strany do

2876

Strany počet

7

URL

https://www.scopus.com/record/display.uri?eid=2-s2.0-85054508531&origin=inward&txGid=ae3662c9abcfeb433403bd7d19b1fd46

BibTex

@article{BUT151831,
  author="Ivana {Kumpová} and Michal {Vopálenský} and Tomáš {Fíla} and Daniel {Kytýř} and Daniel {Vavřík} and Martin {Pichotka} and Jan {Jakůbek} and Zbyněk {Keršner} and Jiří {Klon} and Stanislav {Seitl} and Jakub {Sobek}",
  title="On-the-Fly Fast X-Ray Tomography Using a CdTe Pixelated Detector – Application in Mechanical Testing",
  journal="IEEE TRANSACTIONS ON NUCLEAR SCIENCE",
  year="2018",
  volume="65",
  number="12",
  pages="2870--2876",
  doi="10.1109/TNS.2018.2873830",
  issn="0018-9499",
  url="https://www.scopus.com/record/display.uri?eid=2-s2.0-85054508531&origin=inward&txGid=ae3662c9abcfeb433403bd7d19b1fd46"
}