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KADLEC, R. KŘÍŽ, T.
Originální název
Electric Field Strength in Layered Materials with Varied Parameters
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The authors report on an analysis of conditions on the boundary between layers having varied electromagnetic properties. Wave propagation in a layered material structure is discussed, utilizing analytical formulas for electric field strengths based on Snell's law and employing the Ray-tracing method for calculations associated with the propagation of the electromagnetic field. The analysis-related tasks are solved in the Matlab program. In our previous publications, this approach was compared with the analysis that exploits the FEM applied to the wave equation. The analytical solution includes the time-dependent propagation of electromagnetic waves in a heterogeneous medium and evaluates the distribution of the electromagnetic field on the surfaces of the boundaries at certain moments of time. The main designed algorithm facilitates simple evaluation of all components of the electromagnetic field in relation to the speed of the wave propagation in a heterogeneous medium. Silicon was chosen as a sample material. The material parameters are used with respect to their dependence on the wavelength of the electromagnetic wave; these parameters are obtained from the Refractive index database.
Klíčová slova
Snell's law; Ray-tracing; electromagnetic waves; heterogeneous medium
Autoři
KADLEC, R.; KŘÍŽ, T.
Vydáno
1. 8. 2018
Nakladatel
IEEE
Místo
Toyama, Japan
ISBN
978-4-88552-316-8
Kniha
Progress in Electromagnetics Research Symposium (PIERS-Toyama)
ISSN
1559-9450
Periodikum
Progress In Electromagnetics
Stát
Spojené státy americké
Strany od
347
Strany do
351
Strany počet
5
URL
https://ieeexplore.ieee.org/document/8597924
BibTex
@inproceedings{BUT153288, author="Radim {Kadlec} and Tomáš {Kříž}", title="Electric Field Strength in Layered Materials with Varied Parameters", booktitle="Progress in Electromagnetics Research Symposium (PIERS-Toyama)", year="2018", journal="Progress In Electromagnetics", pages="347--351", publisher="IEEE", address="Toyama, Japan", doi="10.23919/PIERS.2018.8597924", isbn="978-4-88552-316-8", issn="1559-9450", url="https://ieeexplore.ieee.org/document/8597924" }