Detail publikace
Optimization of Deposition Parameters of a DLC Layer Using (RF) PECVD Technology
PROKEŠ, T. MOURALOVÁ, K. ZAHRADNÍČEK, R. BEDNÁŘ, J. KALIVODA, M.
Originální název
Optimization of Deposition Parameters of a DLC Layer Using (RF) PECVD Technology
Typ
kapitola v knize
Jazyk
angličtina
Originální abstrakt
The aim of this study was to carry out a planned experiment (DoE) in order to find a suitable combination of deposition parameters to increase the hardness of the coating. In a 20-round experiment, parameters of chamber pressure, gas flow and the power of an RF source were gradually changed. Subsequently, a micro hardness analysis was carried out using the Berkovich method. Using the DoE method, a combination of parameters was detected within which a comparable hardness of the coating was achieved as with doping of the hydrogen atoms coating to increase the number of Sp3 carbon bonds. Within the indentation test, a scratch test was carried out to determine the normal force required to break the coating.
Klíčová slova
DLC, RF PECVD, Coating hardness, scrath test, DoE, Berkovich
Autoři
PROKEŠ, T.; MOURALOVÁ, K.; ZAHRADNÍČEK, R.; BEDNÁŘ, J.; KALIVODA, M.
Vydáno
11. 3. 2021
Nakladatel
Springer International Publishing
Místo
Švýcarsko
ISBN
978-3-030-61659-5
Kniha
Recent Advances in Soft Computing and Cybernetics
ISSN
1434-9922
Periodikum
Studies in Fuzziness and Soft Computing
Ročník
2021
Číslo
403
Stát
neuvedeno
Strany od
53
Strany do
62
Strany počet
10
URL
BibTex
@inbook{BUT157677,
author="Tomáš {Prokeš} and Kateřina {Mouralová} and Radim {Zahradníček} and Josef {Bednář} and Milan {Kalivoda}",
title="Optimization of Deposition Parameters of a DLC Layer Using (RF) PECVD Technology",
booktitle="Recent Advances in Soft Computing and Cybernetics",
year="2021",
publisher="Springer International Publishing",
address="Švýcarsko",
pages="53--62",
doi="10.1007/978-3-030-61659-5\{_}5https://link.springer.com/chapter/10.1007/978-3-030-61659-5\{_}5",
isbn="978-3-030-61659-5",
url="https://link.springer.com/chapter/10.1007/978-3-030-61659-5_5"
}