Detail publikace

Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison

GRILL, R.

Originální název

Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The comparison of technology, conductivity mechanisms, capacitance and their activation energies is performed for NbO and Ta capacitors. Va caracteristics in normal and reverse mode at room and elevated temperatures have been measured and MIS structure characteristics have been evaluated.

Klíčová slova v angličtině

NbO capacitors, Ta capacitors, MIS structure characteristics, Nb2O5, Ta2O5

Autoři

GRILL, R.

Rok RIV

2005

Vydáno

1. 1. 2005

Nakladatel

IMAPS Benelux

Místo

Bruggy, Belgie

Strany od

540

Strany do

545

Strany počet

6

BibTex

@inproceedings{BUT16509,
  author="Josef {Šikula} and Vlasta {Sedláková} and Jan {Hlávka} and Pavel {Höschel} and Roman {Grill} and Zdeněk {Sita} and Tomáš {Zedníček}",
  title="Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison",
  booktitle="15th European Microelectronics and Packaging Conference Proceedings",
  year="2005",
  pages="6",
  publisher="IMAPS Benelux",
  address="Bruggy, Belgie"
}