Detail publikace

Synchronous Evacuation for Dual Virtual Machines Under Disaster Risks

BAO, N. SAHOO, S. MING, K. LI, G. HORVÁTH, T.

Originální název

Synchronous Evacuation for Dual Virtual Machines Under Disaster Risks

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Network virtualization enables Internet service providers to flexibly provision heterogeneous virtual networks (VNs) over shared substrate networks (SNs). As more and more applications are carried by VNs, the survivability of VNs becomes a critical challenge under large-scale disaster risks. In this paper, we propose a synchronous evacuation strategy for VNs with dual virtual machines (VMs) inside a disaster risk zone (DRZ), which suffer higher risks than the VNs with single VM inside the DRZ. The evacuation strategy exploits post-copy technique to sustain the online service alive and enhances synchronous VM migrations to shorten the dual-VM evacuation time. Numerical results show that the proposed strategy can achieve satisfactory performances in terms of average and total evacuation times of dual-VMs.

Klíčová slova

Disaster risk; live migration; synchronous evacuation; virtual machine; virtual network survivability

Autoři

BAO, N.; SAHOO, S.; MING, K.; LI, G.; HORVÁTH, T.

Vydáno

10. 9. 2020

Nakladatel

IEEE

Místo

USA

ISBN

978-1-7281-6376-5

Kniha

2020 43rd International Conference on Telecommunications and Signal Processing (TSP)

Strany od

27

Strany do

30

Strany počet

4

URL

https://ieeexplore.ieee.org/document/9163586/

BibTex

@inproceedings{BUT165540,
  author="Ning-Hai {Bao} and Subhadeep {Sahoo} and Kuang {Ming} and Guo-Ping {Li} and Tomáš {Horváth}",
  title="Synchronous Evacuation for Dual Virtual Machines Under Disaster Risks",
  booktitle="2020 43rd International Conference on Telecommunications and Signal Processing (TSP)",
  year="2020",
  pages="27--30",
  publisher="IEEE",
  address="USA",
  doi="10.1109/TSP49548.2020.9163586",
  isbn="978-1-7281-6376-5",
  url="https://ieeexplore.ieee.org/document/9163586/"
}