Detail publikace

Negative Sequence Changes Calculation for Purposes of Fault Localization

KRČÁL, V. TOPOLÁNEK, D.

Originální název

Negative Sequence Changes Calculation for Purposes of Fault Localization

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper is focused on calculation of negative sequence changes of voltage and current from distributed measurement. These changes are necessary for evaluation of a new fault localization method Vdip. A principle of changes calculation is described, and problems affiliated with phasor estimation are discussed. Solutions for suppressing major disturbances, such as frequency deviation and interharmonics, are suggested. A way of cancelling out interharmonics based on averaging in sliding windows is presented. Eventually, a calculation procedure is formed, and performance of individual proceedings is tested. The analysis shows that optimized setting of time frames, from which the changes are calculated, is essential to mitigate negative impacts of the major interharmonic frequencies, and can substitute utilization of digital filtering.

Klíčová slova

Negative sequence changes; fault localization; voltage dip; phasor estimation; interharmonics

Autoři

KRČÁL, V.; TOPOLÁNEK, D.

Vydáno

19. 10. 2020

Nakladatel

CVUT-Czech Technical University in Prague

Místo

Prague, Czech Republic

ISBN

978-1-7281-9479-0

Kniha

Proceedings - 2020 21st International Scientific Conference on Electric Power Engineering

Číslo edice

1.

Strany od

29

Strany do

34

Strany počet

6

URL

https://ieeexplore.ieee.org/document/9269219

BibTex

@inproceedings{BUT165724,
  author="Vít {Krčál} and David {Topolánek}",
  title="Negative Sequence Changes Calculation for Purposes of Fault Localization",
  booktitle="Proceedings - 2020 21st International Scientific Conference on Electric Power Engineering",
  year="2020",
  number="1.",
  pages="29--34",
  publisher="CVUT-Czech Technical University in Prague",
  address="Prague, Czech Republic",
  doi="10.1109/EPE51172.2020.9269219",
  isbn="978-1-7281-9479-0",
  url="https://ieeexplore.ieee.org/document/9269219"
}